摘要
成像光谱仪能够获得目标表面图像特征和频谱特性,提高目标识别分析能力,在军用、民用领域有广泛应用。红外焦平面阵列的等光程间隔采样特性是限制光谱仪分辨率的重要因素。激光干涉光路与成像系统同光路,为红外焦平面阵列提供采样触发信号,实现等光程差采样。通过搭建激光偏振移相干涉光路,对干涉信号幅值和相位差进行理论分析和实际验证,最终调试得到两路正交干涉信号,相位差范围为84.6°~93°,反射透射光强幅值比例小于1∶1.05。实验结果表明,干涉光路中1/8波片角度、偏振分光片角度、探测器位置等参数是影响干涉信号幅值和相位差的重要因素。
The imaging spectrometer obtains both the target surface characteristics and spectral characteristics of the image to improve object recognition analysis,and is applied widely in the military and civilian fields.Optical path interval sampling performance of the infrared focal plane arrays limits the resolution of the spectrometer.The polarization phase-shifting laser interferometer sharing the same optical path with the imaging system is designed to offer a sampling signal to achieve an aplanatic interval sampling.The amplitude and the phase error are analyzed,and experimentally verified the two orthogonal interference signals are obtained.The results show that the angle of the 1/8plate,the angle of the polarizing beam splitter and the positions of the detectors are important factors affecting the amplitude and phase of the interference signal.
出处
《光学与光电技术》
2016年第2期40-45,共6页
Optics & Optoelectronic Technology
基金
国家重大科学仪器设备开发专项(2013YQ290489)资助项目
关键词
成像光谱仪
等光程差采样
激光偏振移相
幅值和相位差
1/8波片
偏振分光片
探测器位置
imaging spectrometer
optical path difference sampling
laser polarization phase-shifting
error of the amplitude and phase
1/8plate
polarizing beam splitter
positions of the detectors
