锆合金氧化膜微观缺陷的量化表征

Quantitative Characterization of Micro-defect in Zircaloy Oxide Films

基于离子在氧化膜中的迁移,建立一种可量化表征合金氧化膜微观缺陷的离子迁移方法(IMM)。利用IMM方法,对不同成分的锆合金在不同条件下腐蚀得到的氧化膜样品进行了测试。结果表明:建立的方法能清楚地反映氧化膜中的微观缺陷情况以及微观缺陷随腐蚀条件的变化。该方法进一步完善后,可以为合金氧化微观结构量化分析提供一个有效手段。

Basing on ion migration in xide films, a original method named IMM （Ion Migration Method） has been established to characterize the micro-defects in oxide films quantitatively. Several kinds of zircaloy oxide films formed at different corrosion conditions, were measured by IMM. On the basis of the results, it is concluded that IMM can distinguish the micro-defect difference between the different samples and the micro-defects evolution during the corrosion sensitively. After IMM has been further improved, it will be a effective method to analyse the microstructure of oxide films.