一种可编程的老化感知触发器设计

A Programmable Aging-aware Flip-flop Design

随着云计算和大数据时代的到来,人们对集成电路可靠性的要求越来越高.再加上晶体管尺寸及栅氧厚度的不断缩小,NBTI效应已经成为影响集成电路可靠性的重要因素.针对这一问题,提出了一种可编程的老化感知触发器,目的是为了监控老化效应,避免老化引起的故障.这种设计将有效地提高老化预测的准确性.

With the advent of cloud computing and big data,the reliability of integrated circuit is highly required. Besides,shrinking the size of transistor and thickness of lattice oxygen made NBTI effect become the important factor which influence the reliability of integrated circuits. The purpose of putting forward this programmable aging- aware flip- flop is to monitor the aging effect and avoid some fault caused aging and the design will effectively improve the accuracy of aging prediction.