摘要
现在的集成电路测试系统虽然具备较高的技术指标,但仍然有一些数字、模拟和数模混合电路的参数指标超出其测试能力范围。在新品验证阶段要实现功能与参数的全覆盖测试,难度大而且成本高。通过测试系统与仪器仪表相结合的方式来实现功能与参数的测试验证是一种比较好的解决方法。主要介绍如何使用TR6800测试系统通过GPIB接口控制示波器来实现VCO器件参数测试的方法。
This days, most of test systems have highly performance, but many specs of the digital or analog IC beyond the ability of the test systems. It's very difficult and expensive to get fully tests for functions and parameters during the stage of a new production. A better method by using instruments connect with the test systems can solve the problems, The paper is mainly to introduce how to use the TR6800 test system controls the OSC with the GPIB interface to achieve testing parameters of VCO.
出处
《电子与封装》
2016年第4期9-12,共4页
Electronics & Packaging