存储测试模块抗高冲击结构设计研究

Anti-impact Design for Storage Test Module

通过分析高过载条件下存储测试模块的侵彻破坏机理及其缓冲防护原理,并对撞击过程进行动态模拟,分析电路板所受最大应力及衰减情况,从而得出关于存储模块的微型化设计,根据牛顿第二定理建立了存储模块的波动方程,研究了应力波在变截面体的传播规律,得出应力波的传递特性。与传统的存储结构进行分析比较,并进行炮击试验,得到最大加速度值约40 000g,传统结构最大加速度值约60 000g,该结构具有更高的缓冲性能与抗冲击性。

Based on analysis on penetration failure mechanism and buffering protection principles of storage test module under high-overload and dynamic simulation on impact,the maximum stress which circuit board suffered from and its attenuation were analyzed,accurate data and some conclusions about structure miniaturization were got. According to Newton＇s second theorem,the wave equation of the module was established and the stress wave propagation in variable sections was acquired. Compared with traditional structures by means of shelling,the maximum acceleration of the proposed is about 40 000 while that of the traditional is about 60 000,from those experimental results,it can be concluded that the proposed structure in this paper has higher cushioning properties and impact resistance.