X射线荧光面扫描分析技术在文物保护中的应用

The Application of X-ray Fluorescence Map Scanning Analysis Technique in the Cultural Relic Conservation

X射线荧光分析法由于其分析速度快、可测元素范围广、检出限低等优点被广泛应用于各个领域。X射线荧光面扫描分析技术将光学图像与元素分析完美地结合,为科研工作者的研究和分析提供了新的分析手段。通过对文物面扫描分析可得到文物整体元素分布图,对研究文物的组成、制作工艺及辩伪有非常重要的意义。

Because of the fast testing speed,wide detectable elemental range,low determination limit and other advantages,the X-ray fluorescence map scanning analysis technique is widely applied in many disciplines.X-ray fluorescence map scanning analysis technique perfectly integrates the optical images and element analysis and provides new analyzing method for the studies of the scientists and researchers.Through the map scanning of the cultural relics,the comprehensive distribution diagrams of elements of the cultural relics can be obtained,which is significantly meaningful for the researches on the compositions,manufacturing techniques and forgery detections of the cultural relics.