摘要
在SRAM抗辐射加固设计中,纠错编码(Error Correcting Code,ECC)是一种解决空间环境中SRAM单粒子翻转效应的有效方法。但目前国内外对于基于ECC加固的SRAM可靠性评估体系的研究并不完全成熟,还没有一个统一的标准。基于空间环境下SRAM所产生软错误的错误分布图样特性和错误重叠特性,对已有的基于ECC加固的SRAM空间可靠性评估方案进行修正,得到了一种更加精确的评估模型。
In the radiation hardening design of SRAM,ECC(Error Correcting Code)is an effect way to alleviate the effect of single event effect.Nowadays the evaluation system for ECC strengthened SRAM is not fully mature at home and abroad,and there is no uniform standard.Based on the characters of error profile and error overlap of single event effect in SRAM under space environment,the existing evaluation systems for ECC strengthened SRAM under space environment were revised,and a more accurate evaluation model had been built.
出处
《微电子学》
CAS
CSCD
北大核心
2016年第2期267-272,共6页
Microelectronics
基金
航空科学基金资助项目(20090580013
20110580002)
中央高校基础研究基金资助项目(ZYGX2011J131)