摘要
采用磁控溅射方法制备了单晶Fe_3O_4超薄膜,系统研究了厚度(3~30nm)对薄膜磁性的影响。X射线衍射证明了Fe_3O_4单晶薄膜是(220)晶向,(220)衍射峰的半高全宽和晶格常数随薄膜厚度的下降而增大。磁性测量观察到了清晰的磁滞回线,饱和磁化强度达400×103 A/m。低温电阻率测量证实了薄膜在120K温度附近发生了导体向绝缘体的Verwey转变。利用原子力显微镜观察到Fe_3O_4薄膜的表面粗糙度非常低,适用于纳米尺度自旋电子学器件的开发。
Ultra-thin Fe_3O_4 films with single crystal structure have been prepared by magneto sputtering method,and the effect of film thickness(3~30nm)on magnetic properties was systematically investigated.X ray diffraction results show that the Fe_3O_4 films grow along(220)crystal direction,and the full width at half maximum for(220)peak of Fe_3O_4 films becomes wider and wider with the film thickness decrease.Magnetization curves were clearly observed and the saturated magnetization intensity can be 400×103 A/m.The measurement of resistivity at low temperature confirms the Verwey transition from conductivity to insulator at around 120 K.It is seen that the surface roughness of Fe_3O_4 film is very low measured by atomic force microscopy,which indicate the Fe_3O_4 film is suitable for the development of nano-scaled spin electronic devices.
出处
《金属功能材料》
CAS
2016年第2期26-29,共4页
Metallic Functional Materials
基金
国家自然科学基金项目(51471046)
辽宁省教育厅重点实验室项目(LZ2015039)
中央高校基本科研业务费项目(L150202
N151004002)
东北大学人才引进项目
东北大学大学生创新项目(151095)