摘要
针对镀铜高分子微球X射线图像中多个微球互相粘连,设计了一种简单高效的微球自动计数及缺陷检测方法。通过阈值化和形态学处理,实现了粘连微球的分离计数;使用区域标记和模板匹配,获取微球中心坐标;通过中心坐标定位微球区域,依据微球内部平均灰度实现了微球的缺陷检测。试验结果表明,该方法具有计数速度快,检测精度高,适用性强的特点。
In the X-ray images of copper-plated polymer composite conductive microsphere, a simple and efficient automatically processing method is presented in this paper to separate overlapped microspheres and defects are extracted.Through image threshold and morphology, it counts the microspheres; based on labeling, template matching and microspheres area locating, defects are extracted by the mean gray. Experimental results indicate that, the method has the advantages of high speed, high detect precision and strong applicability.
出处
《计算机工程与应用》
CSCD
北大核心
2016年第9期263-266,共4页
Computer Engineering and Applications