摘要
Y2000-62067-236 0013219用于半导体激光器研究,作为诊断工具的界面噪声相干测量=Inter-facet noise correlation measurement as adiagnostic tool for semiconductor Laser studie[会,英]/Edwards,P.J.& Ganeshkumar,G.//1998 IEEE In-ternational Conference on Optoelectronic and Microelec-tronic Materials and Devices.—236～239(EC)
出处
《电子科技文摘》
2000年第8期74-75,共2页
Sci.& Tech.Abstract
