摘要
Y2000-62040-880 0021267宽带采样系统中的孔径抖动效应=Aperature jitter ef-fects in wideband sampling systems[会,英]/Kobayashi,H.& Morimura,M.//Proceedings of 16th IEEE Instru-mentation and Measurement Technology Conference,Vol.2.—880～885(F)Y2000-62372-316 0021268螺旋波等离子源用的模糊控制器开发=Developing afuzzy controller for a helicon plasma source[会,英]/Lund,T.& Cheetham,A.D.//1999 Third Interna-tional Confefence on Knowledge-Based Intelligent Infor-mation Engineering Systems(Proceedings KES’99).—316～319(PC)
出处
《电子科技文摘》
2000年第12期139-143,共5页
Sci.& Tech.Abstract
