水胁迫条件下冬小麦各部位的全硅含量分析

Total silicon content analysis of winter wheat under different water stress conditions

以冬小麦‘邯4589’为材料,测定了不同水胁迫条件下15个部位全硅含量。结果表明：茎秆的全硅含量,无论以百分含量计、以单位地上物干重计,均表现出较其他暴露部位更加明显的随水胁迫程度加重而降低的趋势。茎干中全硅含量为0.4%～1.5%,变幅较麦糠（2.9%～3.3%）大,随水胁迫变化的稳定性较各级叶片（1.3%～3.8%）和叶鞘（1.5%～2.4%）好,可作为研究全生育期水胁迫等的重点取材对象。

In this research,the total silicon content in 15 parts of winter wheat‘Han 4589＇was measured under different water stress conditions.The results showed that the silicon concentration in stems was more significantly decreased with the increase of water stress than other exposed parts of the wheat,no matter it was calculated based on percent content or overground dry weight.The range of silicon content in stems was about 0.4%-1.5%,the variable amplitude of which was more than that of husks（2.9%-3.3%）.The stability of silicon content in stems under water stress was much more constant than that in leaves（1.3%-3.8%）and sheath（1.5%-2.4%）.Therefore,the stems can be ideal materials for silicon measurement in the study of water stress during the growth period of wheat.