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精密测距仪——μ—base测距精度测试方法与分析 被引量:4

Ranging Accuracy Testing Methods and Analysis of Precise EDM μ- base
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摘要 新型μ-base精密测距仪是一款高精度基线测距仪,它采用ADM测距原理,在使用角隅棱镜(CCR1.5“,RRR1.5”)时,其在160m的范围内的测距精度优于10μm。本文在分析ADM测距原理的基础上,利用双频激光干涉仪校准装置,采用“平面镜反射扩大量程”的方法,对仪器的测距精度、测程等指标进行测试,对测量的结果进行了评定和分析,并给出一些可较大程度保证其精度的使用条件和使用方法。 Applying the absolute distance meter (ADM) technology, the new μ - base is a kind of high - accuracy elec- tronic distance measurement (EDM). The measuring accuracy is better than 10μm within the range of 160 meters using the cor- ner cube ( "CCR1.5, RRR1.5" ). Based on the analysis of ADM principle, the measuring accuracy and range are tested with a dual - frequency laser interferometer using the method of "expanding range with plane mirror". The measuring results are evalua- ted and analyzed, and service conditions and application methods that can ensure the measuring accuracy are presented.
出处 《测绘科学与工程》 2016年第2期18-23,27,共7页 Geomatics Science and Engineering
关键词 μ-base EDM ADM 测距精度 双频激光干涉仪 μ- base EDM ADM ranging accuracy dual - frequency laser intefferometer
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