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灰度与亮度拟合对LCD面板Mura改善的影响 被引量:1

Influence of fitting curve between grayscale and brightness on Mura improvement of LCD panel
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摘要 选择有限的采样灰度级准确拟合出整个灰度区间的亮度和灰度关系,是影响LCD面板Mura改善效果、实时性和成本的关键因素。通过迭代方法优化采样灰度级,并采用分段伽马拟合方法研究了采样灰度级对Mura改善的影响。针对1 920×1 080的55inTFT-LCD模组,6个采样灰度级的优化使拟合亮度曲线与实际亮度曲线的相对误差之和在0~255灰度级从5.64降到3.68,4个采样灰度级的优化使相对误差之和从29.27降到8.98。通过对6个和4个优化采样灰度级的实验结果比较和分析,结果表明,4个优化采样灰度级可以在Mura改善效果、实时性及成本三者之间达到较好的平衡。 It is a key issue to select limited sampled grayscales to fit the curve accurately between the luminance and whole grayscales that affect the Mura improvement, real time, and cost of LCD panels. The limited sampled grayscales were optimized by the iterative method, and the influence of the opti- mized grayscales on the Mura improvement was investigated by the segmented gamma fitted method. To a 55 in TFT-LCD module with resolution of 1 920×1 080, the relative error in 0--255 grayscale between fitting and actual brightness curve decreases from 5.64 to 3.68 with optimization of six sam- pied grayseales and from 29.27 to 8.98 with optimization of four sampled grayscales. The experimen- tal results of six and four optimized sampled grayseales on the mura improvement indicates that the rnura improvement effect, real-time, and cost of LCD panels by using four optimized sampled grayscales are better.
出处 《液晶与显示》 CAS CSCD 北大核心 2016年第5期442-448,共7页 Chinese Journal of Liquid Crystals and Displays
基金 国家自然科学基金(No.61372018)~~
关键词 液晶显示屏 Mura缺陷 分段伽马拟合 LCD Mura defect segmented gamma fitting
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  • 1屈惠明.TFT-LCD屏缺陷检测的研究[J].光电子技术,1997,17(2):102-109. 被引量:10
  • 2焦卫东,杨世锡,钱苏翔,严拱标.乘性噪声消除的同态变换盲源分离算法[J].浙江大学学报(工学版),2006,40(4):581-584. 被引量:13
  • 3高阳,李言俊,张科.非均匀背景下的红外图像曲面拟合分割[J].光电工程,2006,33(7):83-87. 被引量:3
  • 4张昱,张健.基于多项式曲面拟合的TFT-LCD斑痕缺陷自动检测技术[J].光电工程,2006,33(10):108-114. 被引量:19
  • 5JIANG B,WANG C,LIU H.Liquid crystal display sur-face uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques[J].International Journal of Production Research,2005,43(1):67-80.
  • 6LU C,TSAI D.Automatic defect inspection for LCDs using singular value decomposition[J].The International Journal of Advanced Manufacturing Technology,2005,25(1):53-61.
  • 7TSAI D,HUNG C.Automatic defect inspection of pattern-ed thin film transistor-liquid crystal display(TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition[J].International Journal of Production Research,2005,43(21):4589-4 607.
  • 8LEE J,YOO S.Automatic detection of region-Mura defect in TFT-LCD[J].IEICE Transactions on Information and Systems,2004,87(10):2 371-2 378.
  • 9CHEN S,CHOU S.TFT-LCD Mum defect detection using wavelet and cosine transforms[J].Journal of Advanced Mechanical Design,Systems,and Manufacturing,2008,2(3):441-453.
  • 10GABOR D.Theory of communication[J].J.IEE,1946,93(26):429-457.

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