摘要
使用自制的微波等离子体化学气相沉积装置,以乙醇为碳源在(100)硅表面制备了金刚石膜;然后用浓硝酸和氢氟酸的混合溶液腐蚀硅,制备出金刚石膜窗口。使用场发射扫描电镜(SEM)、X射线衍射、拉曼光谱(Raman)、原子力显微镜(AFM)表征和分析金刚石膜,并以自制的漏气率测量系统测量金刚石膜窗口的漏气率。结果表明:金刚石膜的厚度为15μm,平均粗糙度值Ra为39.5nm,晶粒的尺寸大小为30nm,漏气率为8.8×10^(–9) Pa·m^3/s。
Anew nanocrystalline diamond film is prepared in C2 H6O∕H2 using self-made microwave plasma chemical vapor deposition(MPCVD) system.The nanocrystalline diamond film is deposited on the surface of (100)-oriented Si wafer.Then a nanocrystalline diamond vacuum window is achieved after the silicon wafer is corroded by a mixture of nitric acid and hydrofluoric acid.The morphology, grain size,microstructure,orientation or texture,and crystalline quality of the diamond samples are characterized by scanning electron microscopy (SEM),X-ray diffraction,micro-Raman spectroscopy, and atomic force microscopy (AFM).The final window has a thickness of 15 μm,with surface roughness of Ra 39.5 nm and grain size of 30 nm.According to self-made leakage rate system,the air leakage rate of this vacuum window is 8.8×10 -9 Pa.m3∕s.
出处
《金刚石与磨料磨具工程》
CAS
2016年第2期24-26,36,共4页
Diamond & Abrasives Engineering
关键词
金刚石膜
真空窗口
微波等离子体化学气相沉积
漏气率
diamond film
vacuum window
microwave plasma chemical vapor deposition
air leakage rate