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智能电网用高功率密度1500A/3300V绝缘栅双极晶体管模块 被引量:18

High Power Density 1 500A/3 300V Insulated Gate Bipolar Transistor Module for Smart Grid Application
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摘要 基于双扩散金属氧化物半导体(diffused metal-oxide semiconductor,DMOS)元胞设计技术,针对智能电网的需求,引入"电子注入增强"以及台面栅技术,优化了3 300 V绝缘栅双极晶体管(insulated gate bipolar transistor,IGBT)芯片的整体性能。基于该芯片制造出的1 500 A/3 300 V高功率密度IGBT模块,相对于优化前其额定电流从1 200 A上升到了1 500 A(上升了25%),同时导通压降从2.8 V下降到了2.4 V(下降了14%),最高工作结温从125℃提升到150℃。反偏安全工作区(reverse biased safe operation area,RBSOA)与短路安全工作区(short-circuit safe operation area,SCSOA)测试显示,该模块能在集电极电压为2 000 V的情况下关断3 000 A的电流,并且在栅电压为15 V、集电极电压为2 000 V的短路条件下的安全工作时间超过10?s。测试结果显示,该模块导通压降及开关损耗性能与同类型国际主流产品相当。 In order to meet the demand of the smart grid,electron injection enhanced and terrace gate technology were introduced in the double diffused metal-oxide semiconductor(DMOS) cell design to improve the overall performance of 3 300 V IGBT chip and 1 500 A/3 300 V IGBT module was manufactured based on this chip.Compared to the prior module,the rated current rises from 1 200 A to 1 500 A(25% increased).Meanwhile,the saturation voltage drops from 2.8 V to 2.4 V(14% decreased).Moreover,the maximum operation temperature also rises from 125 ℃ to 150 ℃.The test results of reverse biased safe operation area(RBSOA) and short-circuit safe operation area(SCSOA) show that the module can turn off a current of 3 000 A under a line voltage of 2 000 V and the short-circuit time is over 10 ?s under a 15 V gate voltage and a 2 000 V line voltage.Besides,test results show that its saturation voltage and switching loss are as good as the similar international mainstream products.
出处 《中国电机工程学报》 EI CSCD 北大核心 2016年第10期2784-2792,共9页 Proceedings of the CSEE
关键词 绝缘栅双极晶体管 智能电网 电子注入增强 台面栅 IGBT模块 短路安全工作区 insulated gate bipolar transistor(IGBT) smart grid electron injection enhanced terrace gate IGBT module short circuit safe operation area
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  • 1刘国友,覃荣震,黄建伟,Ian Deviny,罗海辉,Rupert Stevens,吴义伯.高功率密度IGBT模块的研发与特性分析[J].机车电传动,2014(2):6-11. 被引量:8
  • 2陈树勇,宋书芳,李兰欣,沈杰.智能电网技术综述[J].电网技术,2009,33(8):1-7. 被引量:1120
  • 3金锐,于坤山,张朋,刘先正,何维国,刘隽.IGBT器件的发展现状以及在智能电网中的应用[J].智能电网,2013,1(2):11-16. 被引量:21
  • 4Takayuki K, Katsunori A, Yasuhiro N, et al. 1 800 A/3.3 kV IGBT module using advanced trench HiGT structure and module design optimization[C]//PCIM Europe 2014, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and EnergyManagement. Nuremberg, Germany, 2014: 346-353.
  • 5Andenna M, Otani Y, Matthias S, et al. The next generation high voltage IGBT modules utilizing enhanced-trench ET-IGBTs and field charge extraction fce-diodes[C]//2014 16th European Conference on Power Electronics and Applications. Lappeenranta, 2014: I- I I.
  • 6刘国友,覃荣震,Ian Deviny,黄建伟.牵引用3300V IGBT/FRD芯片组设计与开发[J].机车电传动,2013(2):5-8. 被引量:13
  • 7Storasta L, Rahimo M, Bellini M, et al. The Radial Layout Design Concept for the Bi-mode Insulated Gate Transistor[C]//International Symposium on Power Semiconductor Devices and ICs. San Diego, 2011 : 56-59.
  • 8Toyota Y, Watanabe S, Arai T, et al. Novel 3. 3-kV advanced trench HiGT with low loss and low dv/dt noise[C]//International Symposium on Power Semiconductor Devices and ICs. Kanazawa, 2013: 29-32.
  • 9Rahimo M, Kopta A, Linder S. Novel enhance planar IGBT technology rated up to 6.5 kV for low losses and higher SOA capability[C]//International Symposium on Power Semiconductor Devices and ICs. Naples, Italy, 2006: 1-4.
  • 10Praneet B, Peter W, Lee C, et al. Improvements in SOA Ruggedness of 6.5 kV IGBTs[C]//Power Electronics and Applications. Birmingham, 2011: 1-8.

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