ICP-OES常见干扰类型及校正方法探讨

Common Interference Types and Calibration Methods Discussion of ICP–OES

电感耦合等离子体发射光谱仪(ICP–OES)越来越多地应用于各类物质的分析检测。测定复杂样品时,仪器出现各种干扰问题是影响测定结果准确性的主要因素。根据仪器原理及样品进入ICP的顺序,对可能出现的化学干扰、物理干扰、记忆效应、电离干扰和光谱干扰进行原因分析。结合具体实例探讨各类干扰相应的校正方法,可以较好地消除干扰对测定结果的影响。

ICP–OES was increasingly used in various types of analytical detection. Determination of complex samples, all sorts of interference problem of instruments was a major factor influencing the accuracy of the determination results. According to the principle of instrument and the sample into the ICP order,the reasons of chemical interference,physical disturbance,memory effect,ionization interference and spectral interference which maybe generated were analyzed.The corresponding correction methods were discussed with specific examples of various type of interference,which could eliminate interference influence of the determination results well.