期刊文献+

多级倍增超晶格InGaAs雪崩光电二级管的增益-噪声特性 被引量:1

Gain and noise properties of multi-gain-stage superlattice InGaAs avalanche photodiode
下载PDF
导出
摘要 重点研究了多级倍增超晶格InGaAs雪崩光电二级管(APD)的增益和过剩噪声,建立了新的载流子增益-过剩噪声模型。在常规弛豫空间理论基础上分析了其工作原理,考虑了预加热电场和能带阶跃带来的初始能量效应、电子进入高场倍增区时异质结边界附近的弛豫空间长度修正以及声子散射对碰撞离化系数的影响,提出了用于指导该类APD的增益-过剩噪声计算的修正弛豫空间理论。结果表明:在相同条件下,相比于常规的单层倍增SAGCM结构,多级倍增超晶格InGaAsAPD同时具有更高增益和更低噪声,且修正的弛豫空间理论可被推广到更多级倍增的超晶格InGaAsAPD结构,在保证低噪声前提下,通过增加倍增级数可提高增益。 The gain and excess noise of multi-gain-stage superlattice In Ga As APD was mainly studied in this paper, and a new multiplication-excess noise model of carriers was established. Based on the conventional Dead Space Multiplication Theory, we analyzed its working principle. Additionally, we considered initial energy from pre-heat electric field and energy band offset, and the modification of dead space length around heterojunction′ s boundary when carriers entered high-field multiplication layer, as well as the effect of phonon scattering on impact ionization coefficients. Thus we proposed a modified Dead Space Multiplication Theory to guide the calculation of the gain and excess noise factor of this type of APD device. The results demonstrated that under the same condition, multi-gain-stage superlattice In Ga As APD has both higher gain and lower noise than conventional SAGCM APD with a single multiplication layer, and the modified Dead Space Multiplication Theory can be extended to superlattice In Ga As APD structure with more gain stages. On the premise of low excess noise, its mean gain can be improved by increasing number of gain stages.
出处 《红外与激光工程》 EI CSCD 北大核心 2016年第5期111-117,共7页 Infrared and Laser Engineering
关键词 修正的弛豫空间理论 多级倍增超晶格InGaAs APD 碰撞电离 弛豫空间长度 modified dead space multiplication theory multi-gain-stage superlattice InGaAs avalanche photodiodes impact ionization dead space length
  • 相关文献

参考文献10

  • 1Yuan P, Wang S, Sun X, et al. Avalanche photodiodes with an impact-ionization-engineered multiplication region [J]. IEEE Photon Teehnol Lett, 2000, 12(10): 1370-1372.
  • 2Kwon O H, Hayat M M, Campbell J C, et al. Effect of stochastic dead space on noise in avalanche photodiodes[J]. IEEE Trans Electron Devices, 2004, 51(5): 693-700.
  • 3Wang S, Hurst J B, Ma F, et al. Low-noise impact- ionization-engineered avalanche photediodes grown on lnP substrates [J]. IEEE Photon Teehnol Left, 2002, 14 (12): 1722-1724.
  • 4George M W, Madison Compton, David A R, et al. Multi- gain-stage InGaAs avalanche photodiode with enhanced gain and reduced excess noise [J]. IEEE Journal of the Electron Device Society, 2013, 1(2): 54-65.
  • 5Jaroslaw Jurenczyk, Dariusz Zak, Janusz Kaniewski, et al. Influence of a charge region on the operation of InGaAs/ InA1As/InP avalanche photodiodes [J]. Optical Applicata, 2013, 43(1): 39-46.
  • 6Tsang W T. Semiconductor Photodetector [M]. Beijing: Electronic Industry Press, Tsinghua University Press, 1992: 1-332.
  • 7Mclntyre R J. Multiplication noise in uniform avalanche photodiodes[J]. IEEE Trans Electron Devices, 1996, 13(1): 164-168.
  • 8Majeed M Hayat, Oh-Hyun Kwon, Shuling Wang, et al. Boundary effects on multiplication noise in thin heterostructure avalanche photodiodes: theory and experiment [J]. IEEE Trans Electron Devices, 2002, 49(12): 2114-2123.
  • 9Majeed M Hayat, Bahaa E A Saleh, Malvin C Teich. Effect of dead space on gain and noise of double-carrier- multiplication avalanche photodiodes [J]. IEEE Trans Electron Devices, 1992, 39(3): 546-552.
  • 10George M Williams, David A Ramirez, Majeed M Hayat, et al. Time resolved gain and excess noise properties of InOaAs/InA1As avalanche photodiodes with cascaded discrete gain layer multiplication regions [J]. Journal of Applied Physics, 2013, 113(9): 093705-1-093705-11.

同被引文献10

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部