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A new curvature compensation technique for CMOS voltage reference using |V_(GS)| and △V_(BE) 被引量:1

A new curvature compensation technique for CMOS voltage reference using |V_(GS)| and △V_(BE)
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摘要 A new mixed curvature compensation technique for CMOS voltage reference is presented, which resorts to two sub-references with complementary temperature characteristics. The first sub-reference is the source-gate voltage|VGS|p of a PMOS transistor working in the saturated region. The second sub-reference is the weighted sum of gate-source voltages|VGS|n of NMOS transistors in the subthreshold region and the difference between two base-emitter voltages △VBE of bipolar junction transistors (BJTs). The voltage reference implemented utilizing the proposed curvature compensation technique exhibits a low temperature coefficient and occupies a small silicon area. The proposed technique was verified in 0.18 μm standard CMOS process technology. The performance of the circuit has been measured. The measured results show a temperature coefficient as low as 12.7 pprrd /℃ without trimming, over a temperature range from -40 to 120℃, and the current consumption is 50 μA at room temperature. The measured power-supply rejection ratio (PSRR) is -31.2 dB @ 100 kHz. The circuit occupies an area of 0.045 mm2. A new mixed curvature compensation technique for CMOS voltage reference is presented, which resorts to two sub-references with complementary temperature characteristics. The first sub-reference is the source-gate voltage|VGS|p of a PMOS transistor working in the saturated region. The second sub-reference is the weighted sum of gate-source voltages|VGS|n of NMOS transistors in the subthreshold region and the difference between two base-emitter voltages △VBE of bipolar junction transistors (BJTs). The voltage reference implemented utilizing the proposed curvature compensation technique exhibits a low temperature coefficient and occupies a small silicon area. The proposed technique was verified in 0.18 μm standard CMOS process technology. The performance of the circuit has been measured. The measured results show a temperature coefficient as low as 12.7 pprrd /℃ without trimming, over a temperature range from -40 to 120℃, and the current consumption is 50 μA at room temperature. The measured power-supply rejection ratio (PSRR) is -31.2 dB @ 100 kHz. The circuit occupies an area of 0.045 mm2.
出处 《Journal of Semiconductors》 EI CAS CSCD 2016年第5期97-103,共7页 半导体学报(英文版)
基金 Project supported by the National Natural Science Foundation of China(No.61376032)
关键词 voltage reference sub-reference curvature compensation SUBTHRESHOLD voltage reference sub-reference curvature compensation subthreshold
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