基于硅漂移探测器的X射线粉末衍射仪探测记录系统的研究

Novel Detecting and Recording Unit for X-Ray Powder Diffractometer Basedon Silicon Drift Detector

研究了提高X射线衍射强度的方法,将硅漂移探测器(SDD)集成在X射线粉末衍射仪的探测记录系统中,发展出一种新的X射线粉末衍射线的高效探测与记录系统,它包括SDD探测器、单道脉冲分析器和计数电路等部分。测试结果表明,探测记录系统能量分辨率高,可以省去石墨单色器,与常规配备石墨单色器+闪烁/正比探测器的衍射仪相比,衍射强度可提高三到四倍。同时,此探测记录系统可排除样品中荧光元素的干扰,且可用于阵列探测器"阵列"效应失效的测试(如极图、In-Plane分析等)。新系统可提升薄膜材料和凝聚态微纳结构分析的水平。

A novel detecting and recording unit was developed for X-ray powder diffractometer to significantly enhance X-ray diffraction intensity. The newly-developed detecting and recording unit mainly consists of a silicon drift detector,a single channel pulse analyzer and a counting circuit. As shown in the measured results of Si and Fe2O3 powders,the novel low-cost unit significantly increases the energy resolution and diffraction intensity of the Xray diffractometer without a graphite monochromator. To be specific,the intensity is 3 or 4 times stronger than that of the conventional X-ray powder diffractometer with a scintillation / proportional detector and a graphite monochromator. Besides,the new unit effectively eliminates interference of the sample＇s fluorescent elements. When it comes to pole figure and in-plane analysis of thin films and nanostructured materials,the new unit outperforms the array detector because of removal of the limitation on ＂array effect＂.