多频原子力探针显微技术

Multi-frequency atomic force microscopy

不断提高空间分辨率、数据采集速度以及实现材料性质的成像,一直以来就是原子力显微术的发展目标.目前,最可能实现这一目标的手段是近些年发展的多频原子力显微术.多频原子力显微术,即利用多频率激励和/或多频率探测微悬臂的振动信号来研究样品纳米物性的一大类AFM技术.它可以实现针尖与样品间作用非线性信息的提取,在组分探测灵敏度、时间和空间成像分辨率等方面展现了巨大的优势.文中综述了多频原子力显微术所包含的不同实现方法的基本原理,并介绍了它们在高分辨成像、纳米力学、材料、生物等方面的前沿应用实例.此外,为探索多频原子力显微术,我们提出了一种特殊的高次谐振型石英音叉微悬臂模型.最后,文章展望了多频原子力显微术的下一步技术发展和应用研究.

It has always been the goal of atomic force microscopy to improve the spatial resolution, the data acquisition speed and the detection of material properties continuously. At present, the multi-frequency atomic force microscopy, which is a new technology, in recent years is the most possible mean to achieve the goal. Multi-frequency atomic force microscopy, which includes various methods to characterize the samples＇ nanoscale properties, drives and/or detects micro-cantilever vibration by using multiple frequency. It can extract the nonlinear signal between tip and sample with a high composition detection sensitivity as well as temporal and spatial imaging resolution. In this paper, we reviews the basic principle of different implementation methods included in the multi-frequency atomic force microscopy, and illustrates them by some cutting-edge applications in high resolution imaging, nanometre mechanics, materials, biological application, etc. In addition, we proposed a special micro-cantilever model of quartz tuning fork that can be used in the multi-frequency atomic force microscopy. Finally, the article looks forward to its future development and applied research.