硅雪崩光电探测器加速工作寿命试验应用研究

The Application Research of Accelerated Working Life Test for Silicon Avalanceh Photoelecrric Detector

为了通过加速寿命试验评估硅雪崩光电探测器的工作寿命,通过FMEA分析和摸底试验,确定了硅雪崩光电探测器的主要失效模式、敏感应力和极限应力,设计并实施了加速工作寿命试验,得到了与理论分析和摸底试验相同的结果:温度应力是影响硅雪崩光电探测器工作寿命的主要应力,最高工作温度应力极限是130℃,对温度应力敏感的参数是暗电流和前放静态输出电压,验证了加速工作寿命试验方案的合理性和可行性。

In order to evaluate the working life of silicon avalanche photoelectric detector through accelerated life test（ ALT）,failure mode effect analysis（ FMEA） and pretest are implemented to get the main failure modes,sensitive stress and stress limits of silicon avalanche photoelectric detector. Accelerated working life test is designed and implemented. The result,in accordance with theoretical analysis and pretest,shows that： temperature stress is the sensitive stress affecting the working life of silicon avalanche photoelectric detector; 130 ℃ is the temperature stress limits; dark current and static output of preamplifier is the sensitive parameter to temperature stress. The accelerated life test program is proved to be reasonable and feasible.