基于PID自校准算法的IGBT温升控制实现

IGBT Temperature Control Based on Self-calibration PID

针对功率循环实验中绝缘栅双极型晶体管(insulated gate bipolar transistor,IGBT)温度过冲和滞后问题,设计了一种自校准PID算法控制IGBT温升.通过MATLAB进行PID建模及参数仿真,采用电学法测试原理并结合嵌入式系统测试IGBT结温,使用PID自校准算法控制器件温升进行IGBT热疲劳测试.实验结果表明:该算法的调节方式和温度精度都达到理想的效果,改善了系统的动态性能,为IGBT寿命预测提供了一个良好的实验环境.

In order to solve the problem of IGBT temperature overshoot in power cycle test, a self-calibration PID algorithm was designed. PID controller was simulated by MATLAB. IGBT Junction temperature was tested by electrical testing theory and combined with embedded system. The self-calibration PID algorithm was applied to control IGBT junction temperature in thermal fatigue test. Experimental results show that both the self-calibration PID control and temperature can achieve better result. Thus system dynamic performance was improved much. It provided a better experimental environment for the IGBT life prediction.