1ZHU ZhiWu, NING JianGuo& MA Wei 1 School of Mechanics and Engineering, Southwest Jiaotong University, Chengdu 610031, China,2 State Key Laboratory of Explosion Science and Technology, Beijing Institute of Technology, Beijing 100081, China,3 Key Laboratory of Frozen Soil Engineering, CAREERI, CAS, Lanzhou 730000, China.A constitutive model of frozen soil with damage and numerical simulation for the coupled problem[J].Science China(Physics,Mechanics & Astronomy),2010,53(4):699-711. 被引量:3
5Eren H, Sandor L D. Fringe-Effect Capacitive Proximity Sensors for Tamper Proof Enclosures[C]//Sensors for Industry Conference. Houston: IEEE, 2005: 22-26.
6Yang W Q, Peng L. Image Reconstruction Algorithms for Electrical Capacitance Tomography[J]. Meas Sci Technol, 2003(14) : R1-R13.
7Huang S M, Plaskowski A B, Xie C G, et al. Tomographyic Imaging of Two-component Flow Using Capacitance Sensors [J]. J Phys E: Sci Instrum, 1989(22) : 173-177.
8Silva D, Subnel T, Schleieher E, et al. Planar Array Sensor for High-speed Component Distribution Sensors[J] . Sensors, 2007(7) : 2430-2445.
9Yang W Q, York T A. New AC-based Capacitance Tomography System[J]. IEE Proc Meas Sci Technol, 1999(146) : 47- 53.
10Agilent Technologies. Mannual of the 4192A Impedance Analyzer[J/OL]. [2008-09-20]. http://www, agilent, com.