软件调控的三极管放大倍数脉冲测试方法

Transistor Magnification Pulse Test Method by Software Regulation

如今使用晶体管图示仪对半导体三极管放大倍数进行测试的原始方案已经逐步淘汰,取而代之的是自动化较高的各种分立器件测试系统。阐述了影响测量放大倍数的因素和相关的解决方案。介绍了一种用于分立器件测试系统中的半导体三极管放大倍数脉冲测试方法,即软件调控方法。该方法是在普通的软件闭环方法的基础上引进了脉冲方案,采用了CPU控制的脉冲技术对三极管放大倍数进行间断式测量。这种软件调控的方法通过实验进行了验证,结果表明该方法符合相关测试标准,所测放大倍数与DTS-1000测量结果相差不超过±3%。

Nowadays,the original test method of the semiconductor transistor magnification by transistor tracers has been phased out,and the test system is replaced by various high-automation test systems of discrete devices. The factors affecting the measurements of the magnification and related solutions were expounded. A semiconductor transistor magnification pluse test method for the discrete component test system was introduced,which was named software regulation method. The pulse program was introduced based on the common software closed-loop approach. The transistor magnification factors were measured intermittently using the CPU control pulse technology. The software regulation method was verified by experiments. The results show that the method is in accordance with the relevant test standards.The difference between the measured amplification factor and the DTS- 1000 measurement result is not more than ± 3%.