基于IEEE 1500标准的IP核测试壳的设计与验证

Design and Verification of IP Core Test Wrapper Based on IEEE 1500 Standard

IEEE 1500标准对测试壳行为和芯核测试语言进行规定,可有效解决嵌入式IP核测试复用的问题.研究了IEEE 1500标准的测试机制,以ISCAS’89Benchmark S349电路为例,详细设计了符合IEEE 1500标准的测试壳,并对测试壳的全部测试模式进行验证.结果表明,测试壳电路在所有指令下正确有效.实现了测试壳自动生成工具,经Benchmark电路验证,工具能正确生成符合IEEE 1500标准的测试壳电路.

IEEE 1500 Standard defines the behavior of test wrapper and core test language,which enables test reuse for embedded IP cores.Based on the research of IEEE 1500 Standard,the IP core test wrapper of an ISCAS＇89Benchmark S349 circuit is designed and verified.The simulation results are presented showing the efficiency of the test wrapper under all instructions.Wrapper Creator tool is implemented and applied to several benchmarks,through simulation the correctness of tool is verified.