摘要
介绍了一种通过测试进行芯片EMI建模的方法,它能够在信号传输的过程中同时测试到信号线源端和负载端的阻抗及干扰电平,能够避免由于产品功能切换导致的测量误差,且过程简单,所需资源少。
A method for IC EMI modeling through measurement is provided. By using the method, both of the source and load EMI model could be obtained when the signal transmission is in the process. This method can avoid the measurement error due to the product function switching. The method is simple to realize with a few equipments and devices.
