基于任意环境下的动态测试系统设计

Design of Dynamic Test System Based on Random Environment

芯片广泛应用于计算机、办公自动化设备、工业仪器仪表、航天等领域,涉及到国民经济各行各业。芯片的工作稳定受到越来越多的关注,而使用之前的测试是保证芯片可靠的重要环节。以动态测试方法为例,扼要介绍芯片在任意环境下的测试方法,并解析测试过程中的注意事项,为芯片的动态测试提供了较为全面的借鉴。

Chips are widely used in fields of computer,office automation equipment,industrial instrumentation,military aerospace and so on. More and more attention is paid to the stability of the chip,and the test before using is an important link to ensure the reliability of the chip. In this paper,the dynamic test method,used as an example,is briefly introduced in any environment of the chip,and the cautions in the process of testing are analyzed to provide the reference for dynamic test chip.