基于微波分光计的谢乐公式验证实验

Microwave spectrometer verifying Scherrer equation

利用微波分光计和模型来验证谢乐公式.首先对谢乐公式进行无近似修正,以满足本实验的要求;再使用微波分光计,模仿XRD测量方法,对模型进行测量,对所得结果进行分析后,发现其定性地符合谢乐公式所描述规律;随后利用数据处理软件进行数据处理,计算出所需参数的具体值,代入且定量地验证了谢乐公式的数学表达式,最后对实验中的误差进行分析,得出结论,深入对谢乐公式的理解.本文利用微波和自行构建的模型验证了谢乐公式的正确性以及其模拟Ⅹ射线衍射的可行性,同时丰富了大学物理实验微波分光计项目的教学内容,提高学生构建物理模型的创造性.

We conduct a microwave spectrometer experiment to verify Scherrer equation. We derive the equation without approximation to meet the requirement of our experiment. The model, using XRD method, is tested with the microwave spectrometer and the result is analyzed, we have found that it follows the rule indicated by the equation qualitatively. We process the data with software and the result is in agreement well with the mathematic expression formulated by Scherrer equation. We analyze the error at last, promoting the understanding of Scherrer equation. The experiment verifies Scherrer equation and the viability of our model, enriches teaching content of microwave spectrometer experimental project and improves students＇ innovation in building physical model.