摘要
研制了一种基于STM32的微位移检测系统设计方案。通过抑制直流漂移的电路处理模块得到直流稳定的两路光电信号。根据两路光电信号的相位特点,采用STM32同步采样两路光电信号,并利用椭圆拟合、最小二乘法、相位解包裹法对采集的数据进行处理运算,计算出微位移。现场测试结果表明:该系统满足微位移测量要求。
A micro displacement detection system based on STM32 is researched and fabricated. The system uses circuit processing module for restraining DC drift to generate two paths photoelectric signals without DC drift.According to phase characteristics of two paths photoelectric signals,using STM32 synchronous sampling two paths photoelectric signals,using Ellipse fitting algorithm,the leastsquare fitting and phase-unwrapping algorithm to process the acquired datas and workout micro displacement. Field test results indicate that the system satisfies requirements of micro displacement measurement.
出处
《传感器与微系统》
CSCD
2016年第7期83-86,共4页
Transducer and Microsystem Technologies
基金
国家自然科学基金资助项目(51175154
51275157)
湖北省杰出青年人才基金资助项目(2010CDA088)
湖北省教育厅中青年基金资助项目(Q20101405
Q20101407)
湖北省科技厅基金资助项目(2010CDB03104)
