共振光散射法测定复配表面活性剂的临界胶束浓度

Determination of the Critical Micelle Concentration of Compound Surfactants System by the Resonance Light Scattering Method

利用共振光散射技术在不引入探针的条件下,建立了室温下直接测定复配表面活性剂的临界胶束浓度(CMC)的方法。研究发现:在室温下,单一表面活性剂十二烷基苯磺酸钠(SDBS)水溶液的共振光散射强度(RLS)随SDBS浓度的增加而增强;且当SDBS超过其临界胶束浓度时,RLS强度增强幅度减弱。SDBS与溴代十六烷基吡啶(CPB)阴阳离子复配表面活性剂体系同样具有类似特征,据此测定了SDBS和复配体系的CMC,SDBS的CMC为2.6 mmol/L,复配体系的CMC为1.35 mmol/L,结果与表面张力法测定结果基本一致。

In this work, we established a resonance light scattering（RLS）method without any probes forthe determination of critical micelle concentration（CMC）of compound surfactants system. In roomtemperature, the RLS intensity increased with the surfactants concentration, and the increase becameslower when the concentration was over the CMC. The compound system was similar. The results showedthat the CMC of the sodium dodecyl benzene sulfonate（SDBS）was 2.6 mmol/L and the CMC of thecompound system was 1.35 mmol/L. The results were matched with the surface tesion method.