摘要
论文对绝缘子气 -固交界面电荷积聚的法向场强模型进行了分析 ,发现现有的法向场强模型只能解释气体侧有微放电情况下的电荷积聚问题。通过实际测量绝缘子表面电荷的分布 ,对理论研究结果进行了实验验证。首次通过实验观察到直流电压作用下 ,在一定的电压幅值范围内 ,随着电压作用时间的增加 ,绝缘子表面电荷的极性会发生不断反复的翻转。这与国外研究者认为的绝缘子表面电荷积聚会随着电压作用时间的增加逐渐增加 ,进而达到饱和的结果有着显著的不同。
The normal field model of surface charge accumulation at the gas-solid interface of insulator is analyzed. And the result shows that the Normal Field Model can only explain the phenomena of charge accumulation with micro-discharge in gas space. The theoretical analysis is supported by experiments. The experimental results show that within a certain voltage range the polarity of the surface charge will reverse as the DC voltage duration increases. And this phenomenon is in good agreement with the theoretical analysis.
出处
《绝缘材料》
CAS
北大核心
2002年第4期37-40,共4页
Insulating Materials
基金
教育部高校博士点基金资助项目 (2 0 0 10 6980 14 )
