引信典型电子部件长储性能加速退化试验方法

Accelerated Degradation Test Method for Fuze Electronic Device Long Term Storage Performance

针对目前引信电子部件储存性能退化或失效原因研究较少、储存失效原因尚不明确的问题,提出了引信典型电子部件长储性能加速退化试验方法。该方法通过对两个已经储存10年的引信典型电子部件样本开展加速退化试验,定位了易发生退化或失效的元器件。失效原因分析表明,随着时间推移,电子部件零点漂移退化趋势越发明显,而其他参数则相对稳定,电阻元件本身白噪声可能导致电阻元件性能退化。同时,长储导致键合丝断开可能会造成运算放大器性能退化,影响引信可靠性。确定了长储后的引信电子部件在进行检测时应重点关注电阻元件和运算放大器。

Aiming at the problem that there is little study about storage performance degradation for fuze elec-tronic device and the storage failure reason is not clear, an accelerated degradation test method for long -term- storage performance of typical electronic device was presented. The method carried out the accelerated degrada-tion test based on two typical electronic devices which had been stored for 10 years？ and then located the compo-nents which were easy to degradation or failure. Failure analysis showed that the degradation trend of zero drift was obvious over time, and the other parameters were relatively stable. The white noise from the resistance it-self might lead to the degradation of the resistance, at the same time, long storage might result in the broken of bonding wire and caused the degradation of the operational amplifier,then influenced the reliability of the fuze. It was determined that the resistances and operational amplifiers should be concerned when testing fuze electronic devices after long storage.