摘要
随着集成电路产业的飞速发展,人们逐渐认识到集成电路的可靠性不但受到生产工艺的影响,也与其内在设计有着重要关联,因此,对可靠性设计进行研究有着重要的理论意义与实用价值,而在设计阶段考虑可靠性问题已逐渐成为提高集成电路可靠性的重要方法。首先介绍了可靠性设计的发展趋势及可靠性设计的基本含义,接下来对集成电路电迁移失效模式的主要因素进行分析并提出了可靠性设计的具体方法,最后以微分电路电迁移失效为例,利用EDA技术,通过失效模式分析、可靠性模拟、优化改进等步骤,详细介绍了可靠性设计的方法,达到提高集成电路可靠性的目的。
Reliability is focused on along with the development of integrated circuit industry. It is notonly affected by the production process but relates to the inherent design. So, it has important theory andengineering value to research the reliability design of integrated circuit. At first, this paper introduces therecent trends and basic meaning of the reliability design. Then it analyzes the main factor aboutelectromigration failures and proposes the specific method. At last, it introduces its detailed processes bytaking a differentiating circuit for instance and achieves the target to improve the reliability of theintegrated circuit.
出处
《微处理机》
2016年第4期8-11,共4页
Microprocessors
