摘要
透射电子显微镜(Transmission Electron Microscope,TEM)具有很高的分辨率和放大倍数高,广泛应用于实验教学和科学研究各个领域。透射电子显微镜结合不同的附件(X射线能谱分析(EDS)、电子能量损失谱(EELS)),可以同时提供形貌、成分、结构信息,它可以揭示物质内部的微细观结构,是人们了解、认识事物微观结构不可缺少的工具。观察透射电镜的最终目的是得到清晰的照片,而样品的制备是关键。透射电镜样品的制备质量,直接影响到样品的观察效果与分析结果。本文以JEM-2100型透射电子显微镜为例,从样品制备方法的选择、载网与支持膜的选用、样品防污染措施及电镜操作等几方面入手,详细地介绍高质量的透射电镜照片的拍摄经验,为透射电镜相关工作人员提供技术参考。
Transmission electron microscope (TEM) with its high resolution and high magnification is widely used in various fields of scientific research and experimental teaching. TEM combined with different attachments (X-ray energy spectrum analysis (EDS), electron energy loss spectroscopy (EELS)) , can provide the morphology, composition and structure information, at the same time it can reveal the micro structure of the material inside. It is the indispensable tool by which people can understand and know the internal structure of things. Taking high-quality TEM photos is the ultimate aim of TEM, and sample preparation is the key. The quality of TEM' s sample preparation directly affects the observation effect and the analysis results of the sample. In this paper, taking JEM-2100 HRTEM as an example, considering from the requirement of TEM sample preparation, the paper introduced the selection of carrier network and support membrance, the choice of preparation methods, the measures of sample pollution prevention and operation of TEM etc. This paper also introduced the experience of fast shooting a high-quality TEM photo, it can provide technical reference for those who are working in this field.
出处
《实验室研究与探索》
CAS
北大核心
2016年第7期295-301,共7页
Research and Exploration In Laboratory