电子设备诊断规则提取的形式概念分析方法

Formal concept analysis method of extracting diagnosis rule from electronic device

针对从电子设备历史故障数据中获取诊断知识困难的问题,研究了基于形式概念分析的诊断规则提取方法。首先,定义了诊断形式背景以二值数据表形式化表示故障样本,设计了增量式算法分别构造测试参数集和诊断结果集的概念格;然后,根据两概念格外延包含关系构造广义可辨识矩阵和广义决策辨识函数,通过化简极小析取式对诊断形式背景进行属性约简,得到约简的测试参数集;最后,构造约简的概念格提取最优诊断规则集,用于诊断新的测试样本。该方法用于某型电子对抗系统管理控制计算机的诊断准确率达到83.3%,验证了从故障数据中提取诊断规则的有效性。

A diagnostic rule extraction method based on formal concept analysis was proposed in order to solve the problem of hard to acquire diagnostic knowledge from electronic device fault sample. Firstly, diagnostic context of formulate fault sample was defined into binary data, an increment algorithm was designed to construct concept lattice of both test parameters set and diagnostic results set. And then, general discernibility matrices and function were constructed to reduce the attribute of the diagnostic context. The test parameters set was reduced by Boolean reasoning of general discernibility function, then the optimized diagnostic rule set was acquired from the reduced concept lattice. Finally, new test samples could be diagnosed with the optimized diagnostic rules. The diagnosis method was used in the management and control computer in some electronic resist system, and had a diagnosis precision of 83.3%. It validates that the proposed method can acquire effective diagnostic rule from fault sample data.