摘要
该文设计实现了一种半导体激光器综合参数测试实验系统,该系统通过微处理器控制搭建好的激光器驱动电路与激光器温度控制电路,运用控制变量法,分别采集驱动电流或温度改变后激光器的电压、电流和光功率等数据,通过串口将数据返回到上位机进行数据处理并绘制对应的曲线图。通过测试,实验系统可完成激光器综合参数的测试,并可用于光电技术综合实验及专业综合实践能力训练。
A semiconductor laser integrated parametric testing and experimental system is designed and implemented. Its main principle is to control the laser driving circuit and the laser temperature control circuit by microprocessor,then collect the data of voltage and current and optical power of laser with the changing of driving current or temperature. These data can subsequently be loaded on a computer for processing and drawing the graph by serial port. With the testing and experimental system,integrated parameters of laser can be tested. Meanwhile this system also can be used in the comprehensive experiment of photoelectric technology and the training of professional comprehensive practical ability.
出处
《实验科学与技术》
2016年第4期23-26,共4页
Experiment Science and Technology
基金
国家自然科学基金(51404268)
中国矿业大学教改项目(2015YB10)
