齐纳安全栅瞬态效应的测试系统

Test System for Transient Effects of Zener Safety Barrier

针对传统安全栅测试评估手段的不完善,为满足国家标准中二极管安全栅的型式试验,设计了一种齐纳安全栅瞬态效应的测试系统。该系统以齐纳二极管为研究对象,从本质安全的角度,分析了运行在最不利条件下的齐纳二极管预先击穿时间。通过试验确定脉冲电流的宽度与幅值;以绝缘栅双极型晶体管(IGBT)为核心元件,并采用大电容储能网络,设计了脉动电流源。实践表明,该测试技术有效地验证了安全栅承受瞬态效应,为确保防爆安全提供依据。

Aiming at the shortages of traditional test and evaluation method for safety barriers, and for achieving the type test of diode safety barrier in accordance with the national standard, a novel test system for the transient responses of Zener safety barrier is designed. For intrinsic safety,the system takes the Zener diode as the research object; the pre - breakdown time of Zener diode under the worst conditions is analyzed. Through experiments, the width and amplitude of the pulse current are determined, insulated - gate bipolar transistor （IGBT） is selected to be the core component, and the pulse current source is designed by adopting large capacitance energy storage network. The practice shows that the test technology effectively verifies the safety barriers can bear transient effects, and provides basis of ensuring explosion - proof safety.