期刊文献+

多态系统电磁脉冲易损性概率置信下限的贝叶斯估计

Susceptibility Assessment of Multi-State System to EMP with Lower Confidence Limit of Probability Based on Bayesian Method
下载PDF
导出
摘要 针对多态系统电磁脉冲易损性评估问题,提出了基于贝叶斯理论的多态系统电磁脉冲易损性概率置信下限估计方法。分别基于贝叶斯方法及经典统计方法,给出了多态系统电磁脉冲易损性概率置信下限及效应实验达到给定状态概率所需最小样本量的计算方法。通过算例,对文中提出的方法进行了验证和比较。在无信息先验条件下,贝叶斯方法与经典方法计算结果较为接近,概率置信下限和所需最小样本量的估计结果主要依赖于当前实验信息;当先验信息具有显著倾向时,若当前实验信息与先验信息一致,则基于贝叶斯方法计算的概率置信下限更加准确,且所需最小样本量明显少于经典统计方法的计算结果。 An assessment method of the lower confidence limit of probability based on Bayesian theory, which can be used in the susceptibility assessment of the electronic system to electromagnet ic pulse (EMP), is proposed. According to the multi-state phenonmenon of the electronic system and the feature of its EMP effects, the derivations of full probability formula from multinomial and Dirichlet distribution are discussed. The lower confidence limit of each system state probability and the least number of trials with given probability can be determined by using the proposed method. A case demonstrates that, the differences between the results of the proposed method and the classical statistical method are not significant with the non-information prior. But when the prior information is strictly according to the sample information of current experiments, the accuracy of the estimation of each system state probability is improved and the requirement of the number of trials is reduced by the proposed method.
出处 《现代应用物理》 2016年第3期69-74,共6页 Modern Applied Physics
基金 国家自然科学基金重点资助项目(61231003) 国家自然科学基金青年基金资助项目(61201090)
关键词 贝叶斯方法 多态系统 易损性 概率置信下限 Bayesian method multi-state system susceptibility lower confidence limit of probability
  • 相关文献

参考文献20

  • 1NITSCH D, CAMP M, SABATH F, et al. Susceptibility of some electronic equipment to HPEM threats[J]. IEEE Trans Electromagn Compat, 2004, 46(3) : 380 - 389.
  • 2乔登江.高功率电磁脉冲、强电磁效应、电磁兼容、电磁易损性及评估概论[J].现代应用物理,2013,4(3):219-224. 被引量:22
  • 3王建国,牛胜利,张殿辉,等高空核爆炸效应参数手册[M]北京:原子能出版社,2010.
  • 4GIRI D V, TESCHE F M. Classification of intentional elec- tromagnetic environments (IEME) [J]. IEEE Trans Electro magn Compat, 2004, 46(3): 322-328.
  • 5王建国,刘国治,周金山.微波孔缝线性耦合函数研究[J].强激光与粒子束,2003,15(11):1093-1099. 被引量:66
  • 6HOAD R, CATER N J, HERKE D, et al. Trends in EM susceptibility of IT equipment [J]. IEEE Trans Electromagn Compat, 2004, 46(3): 390-395.
  • 7GENENDER E, GARBE H, SABATH F. Probabilistic risk analysis technique of intentional electromagnetic interference at system level [J] - IEEE Trans Electromagn Compat, 2014, 56(1): 200-207.
  • 8RADASKY W A, BAUM C E, WlK M W. Introduction to the special issue on high-power electromagnetics (HPEM) and intentional electromagnetic interference (IEMI) [J]. IEEE Trans Electromagn Compat, 2004, 46(3) : 314 - 321.
  • 9GREASON W D, CASTLE G S P. The effects of electrostatic discharge on microelectronic devices: A review [J]. IEEE TransIndAppl, I984, 20(2): 247-252.
  • 10CAMP M, GARBE H. Susceptibility of personal computer systems to fast transient electromagnetic pulses [J]. IEEE Trans Electromagn Compat, 2006, 48(4) : 829 - 834.

二级参考文献37

  • 1韩峰,王建国,焦李成.模糊神经网络在电子器件微波易损性评估中的应用[J].强激光与粒子束,2004,16(7):909-914. 被引量:12
  • 2陈家鼎,李季.关于结构可靠度的置信下限[J].北京大学学报(自然科学版),2004,40(5):702-711. 被引量:1
  • 3王建国,屈华民,范如玉,陈雨生,张廷斌.孔洞厚度对高功率微波脉冲耦合的影响[J].强激光与粒子束,1994,6(2):282-286. 被引量:21
  • 4James O.Berger原著,贾乃光译,统计决策论及贝叶斯分析,中国统计出版社,1998.
  • 5Martz, H.F. and Waller, R.A., Bayesian Reliability Analysis, John Wiley Sons, New York, 1982.
  • 6GJB538-88半导体器件电磁脉冲损伤阈值试验方法[s].北京:中国标准出版社,1988.
  • 7Green, M. A., Barrett, J. S. A Statistical Method for Evaluating Electrical Failures[J]. IEEE Transaction on power delivery, 1994,9(3) : 1524--1530.
  • 8Chen,M.-H. , Shao,Q, -M. , and Ibrahim,J. G.. Monte Carlo Methods in Bayesian Computation [M]. New York: springer-verlag, 2000.
  • 9Gilks W. R. ,and P. Wild. Adaptive rejection smapiing for Gibbs smapling [J]. Applied Statistics, 1992,41 (2) :337-348.
  • 10唐雪梅 张金槐 等.武器装备小子样试验分析与评估[M].北京:国防工业出版社,2001..

共引文献96

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部