星载温度传感控制芯片的自动测试系统

An Automatic Test System for a Spaceborne Chip of a Temperature-Sensing Controller

为了评估星载相控阵T/R组件的电性能、温度传感和抗单粒子效应能力,针对星载X波段T/R组件中一款自主研发的温度传感控制芯片,设计开发了一套基于Lab VIEW的自动测试系统。系统采用高速数字I/O技术,提高了芯片电性能测试速度;同时系统具备高精度自动温度测试功能,能够精确评估芯片温度传感性能;另外系统具备数据自动处理功能,能够完成芯片电性能测试数据和设计指标的比对、温度测试数据和标定温度的误差分析以及单粒子效应试验前后数据变化量统计。最后采用本系统对芯片功耗、温度传感和抗单粒子效应能力进行了实测分析,测试结果表明该芯片功能正常、性能良好,可用于温度剧烈变化和充满空间辐射的航天环境,同时测试系统具备操作简单、可移植性好、测试速度快和测试精度高等优点。

In order to evaluate the electrical specification,temperature sensing and single event tolerance of space-borne phased-array T/R modules,an automatic test system based on PXI bus is designed and developed. By usingthis test system,the evaluation of a self-developed integrated controller with temperature sensor,which is embeddedin a spaceborne X-band T/R module,is performed in this paper. By using high-speed digital I/O technology,the testspeed of the present test system for electrical characteristics is improved. The ability of automatic temperature testwith high-precision enables the accurate performance assessment of temperature sensing. And with the ability of au-tomatic data processing,the test system can realize the comparison between the measured electrical properties andthe design specifications,the error analyzation between test data and calibration temperature and the variation esti-mation before and after single event effects. Finally,power distribution,temperature sensing and single event toler-ance of the chip are tested and analyzed. The results show that the chip can be well performed in the space environ-ment with rapidly changing temperature and strong radiations. At the same time,the test system has the advantagesof simple operation,well portability,high speed of testing and high precision.