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针对纳米器件缺陷的CMOL电路单元容错映射

Defect-tolerant Cell Mapping in CMOL Circuit with Defect Nanodevices
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摘要 针对CMOL电路中的纳米二极管常闭缺陷的容错映射问题,提出了一种启发式容错映射算法。首先分析纳米二极管常闭缺陷对电路单元映射的影响,以电路中错误的连接数为成本值,采用评价、选择和配置循环迭代,直到容错映射成功。与已有的可满足性方法相比,在一个较合理的时间内可以求解更大规模的电路。 For the problem of defect-tolerant cellmapping in CMOL circuit with stuck-close nanode-vices, an effective heuristic algorithm is proposedcell mapping is analyzed; then takingby evaluation, selection and allocationg Firstly, the impact of stuck - close defects onthe fault connections of circuit asis carried out until defect-tolerantexperiment results indicate that compared with the satisfiability method,solve large scale circuits in a reasonable time.cost function, the iterationmapping successfully. The the proposed method can
作者 汪纪波 夏银水 储著飞
机构地区 宁波大学信息科学与工程学院
出处 《无线通信技术》 2016年第3期46-51,共6页 Wireless Communication Technology
基金 国家自然科学基金(No.61571248)
关键词 纳米电路 CMOL电路 容错映射 常闭缺陷 nano circuit CMOL circuit defect-tolerant mapping stuck-close defect
分类号 TP391 [自动化与计算机技术—计算机应用技术]
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参考文献15

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二级参考文献25

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