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光纤表面粗糙度检测系统的研究 被引量:3

Research of Surface Roughness Detection System Based on Fiber
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摘要 基于传光型光纤传感器,利用反射式光强调制原理,设计了一套材料表面粗糙度的检测系统。整个系统包含光源、Y型光纤束、反射调节控制装置和数据采集部分,采用单片机作为控制系统。分析了光纤束端面与检测样品距离的变化对检测结果的影响。 The design of a surface roughness detection system is based on light-transmitting fiber-optic sensor and the principle of reflecting and optical intensity modulating.The whole system,by single chip microcomputer as the control system,includes light source,Y-type liber bundle,rellection adjustment control device and data acquisition section.It analyzes thatthe change of distance between the liber bundle end lace and thetesting sam-ples has a marked impactontest results.
作者 张成云 刘佐濂 揭海 郑佳 吴伟豪 ZHANG Cheng-yun LIU Zuo-lian JIE Hai ZHENG Jia WU Wei-hao(Guangzhou University,Guangdong Guangzhou 510006)
机构地区 广州大学
出处 《大学物理实验》 2016年第5期30-32,共3页 Physical Experiment of College
基金 广州大学2015年度大学生创新训练项目(201511078064) 广州大学2015年度教育教学研究项目一般项目(JY201548)
关键词 光纤传感器 表面粗糙度 光散射 liber surtace roughness detection system
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  • 1丁红胜,董军军,吴平.综合性设计性实验的教学思路探讨[J].大学物理,2007,26(5):44-47. 被引量:36
  • 2Trumpold G.Interference method of measuring the roughness of a surface [J].Izmer Tekh.1971,8:34-36
  • 3Vry U,Fercher A F.Higher-order statistical properties of speckle fields and their application to rough-surface interferometry [J].Opt Soc Amer,1988,83:787-795.
  • 4Matsumoto H.Synthetic interferometric distance measuring system using a CO2 laser[J].Appl Optics,1986,25:493-498.
  • 5Franco D,Umberto M,et al.Design and performance of an optical sensor for the measurement of surface roughness and waviness[J].SPIE,1999,3823:160-163.
  • 6Pramod K.Optical Measurement Techniques and Applications[M].London:Artech House,1997.
  • 7Hildebrand B P,Haines K A.Multiple-wavelength and multiple-source holography applied to coneration [J].Opt Soc Amer.1967,57(79):155-162.
  • 8Church E L,Jenkinson H A,Zarada J M.Relationship between surface scattering and microtopographic features [J].Optical Engineering,1979,18(2):125-136.
  • 9Leendertz J A.Interferometric displacement measurement on scattering surfaces utilizing speckle effect[J].Phys E Scientific Instr,1970,3:214-218
  • 10维斯特CM.全息干涉计量学[M].北京:机械工业出版社,1984..

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