期刊文献+

In Situ Luminescence Measurement from Silica Glasses Irradiated with 20keV H^- Ions

In Situ Luminescence Measurement from Silica Glasses Irradiated with 20keV H^- Ions
下载PDF
导出
摘要 A new low-energy negative-ion induced luminescence setup was recently developed at the injector of the GIC4117 2 × 1.7 MV Tandem accelerator in Beijing Normal University. In situ luminescence measurements are performed on silica glass by using 20key H ions at room temperature. Gauss fitting of the spectra revealed six overlapping components at about 2.7eV, 2.4eV, 1.geV, 1.8eV, 4.2eV, and 3.6eV, which except for the new observed emission band at 3.6eV are assigned to the creation of type lI oxygen-deficient centers, E' centers, non-bridging oxygen hole centers with different precursor states, and type-I oxygen-deficient centers. The fitted results of the saturation concentration show that self-trapped exciton recombination at type-lI oxygen-deficient centers is the main luminescence emission process. The evolution of the luminescence intensity and full width at half maximums as a function of ion fluence is also discussed. It is found that the number of recombination centers reaches its maximum at lower Huence, and the area ratio between blue bands and red bands is much lower than that under high energy H+ ion irradiation. A new low-energy negative-ion induced luminescence setup was recently developed at the injector of the GIC4117 2 × 1.7 MV Tandem accelerator in Beijing Normal University. In situ luminescence measurements are performed on silica glass by using 20key H ions at room temperature. Gauss fitting of the spectra revealed six overlapping components at about 2.7eV, 2.4eV, 1.geV, 1.8eV, 4.2eV, and 3.6eV, which except for the new observed emission band at 3.6eV are assigned to the creation of type lI oxygen-deficient centers, E' centers, non-bridging oxygen hole centers with different precursor states, and type-I oxygen-deficient centers. The fitted results of the saturation concentration show that self-trapped exciton recombination at type-lI oxygen-deficient centers is the main luminescence emission process. The evolution of the luminescence intensity and full width at half maximums as a function of ion fluence is also discussed. It is found that the number of recombination centers reaches its maximum at lower Huence, and the area ratio between blue bands and red bands is much lower than that under high energy H+ ion irradiation.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2016年第10期90-93,共4页 中国物理快报(英文版)
  • 相关文献

参考文献23

  • 1Townsend P D, Khanlary M and Hole D E 2007 Surf. Coat. Technol. 201 8160.
  • 2Townsend P D and Crespillo M L 2015 Phys. Procedia 66 345.
  • 3Bachiller-Perea D, Jiménez-Rey D, Mu?oz-Martín A et al 2015 J. Non-Cryst. Solids 428 36.
  • 4Crespillo M L, Graham J T, Zhang Y et al 2016 J. Lumin. 172 208.
  • 5Townsend P D and Wang Y F 2013 Energy Procedia 41 64.
  • 6Crespillo M L, Graham J T, Zhang Y et al 2016 Rev. Sci. Instrum. 87 24902.
  • 7Tanabe T, Fujiwara M, Iida T et al 1995 Fusion Eng. Des. 29 435.
  • 8Stevens-Kalceff M A 2009 Mineral. Mag. 73 585.
  • 9Tanabe T, Fujiwara M and Miyazaki K 1996 J. Nucl. Mater. 233 1344.
  • 10Tsuji H, Gotoh Y and Ishikawa J 1998 Nucl. Instrum. Methods Phys. Res. Sect. B 141 645.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部