基于VXI PXI Digital I/O卡的诊断算法研究

Study on the diagnosis algorithm for VXI PXI Digital I/O card

针对目前在生产测试平台中广泛使用的高密度VXI PXI Digital I/O板卡容易损坏且故障定位困难、不便维修和维护的情况,开展了对其进行故障定位的诊断算法研究。研究了包括各种可能出现的错误模型及其相互关系,以及检测和定位这些错误模型的相应算法,并应用相应的算法成功地开发了高密度VXI PXI Digital I/O板卡的自动化诊断系统,大幅提高了生产效率,降低了维护成本,提高了经济效益。

The high density VXI PXI Digital I / O card is widely used in production testing platform currently,but it is easy to be damaged and it is difficult to realize fault location. In order to conveniently repair and maintain,the research of fault based on fault location is carried out.We study on error model including all possible error models and their relationship,and the corresponding algorithm to detect and locate these error models. The related algorithm is used to successfully develop the automatic diagnosis system for the high density VXI PXI Digital I / O card. It greatly improves production efficiency,reduces maintenance cost,and increases economic benefit.