基于扫描探针显微术的微区光电性质测试方法和装置

Scanning Probe Microscopy Based Method and Equipment for Measurement of Local Photoelectric Property

本文以一台常规的Aglient 5500型的扫描探针显微镜为基础,通过配置光源及聚焦系统、研制光强度自动控制部件、研制样品台等方法将太阳光模拟器发射的光引入样品的探针扫描区域,开发了利用扫描探针显微镜原位测试太阳能电池材料微区光电性质的功能。光电性质的测试过程可在手套箱内进行,解决了有机半导体容易吸收空气中的水和氧而失效的问题。

The equipment for in-situ measurement of local photoelectric property of solar cell materials has been developed based on a conventional Aglient 5500 scanning probe microscope.By fabricating the auto-controlled unit for illumination intensity and the sample table,the focused light provided by the solar simulator can be travelled to photoexcite the sample under the tip.The testing process of the photoelectric properties can be carried out in the glove box,which solves the problem that water and oxygen in the air can be absorbed by the organic semiconductor.