摘要
In X-ray absorption fine structure(XAFS) experiments,Soller slits are widely used as filter devices in order to improve the signal to noise ratio.Performing high accuracy manual focusing operations is a time-consuming process;therefore,this work introduces an automatic focusing method for Soller slits in multi-element fluorescence detectors.This method establishes a relation model between the fluorescence intensity distribution and the coordinates of the fluorescence excitation point.According to this relation model,the actual coordinates of the fluorescence excitation point can be deduced from the detected fluorescence intensity distribution and used in focusing operations.This method has proven to be feasible in an XAFS experiment at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility.
In X-ray absorption fine structure （XAFS） experi-ments, Soller slits are widely used as filter devices in order toimprove the signal to noise ratio. Performing high accuracymanual focusing operations is a time-consuming process; therefore, this work introduces an automatic focusing methodfor Soller slits in multi-element fluorescence detectors. Thismethod establishes a relation model between the fluorescenceintensity distribution and the coordinates of the fluorescenceexcitation point. According to this relation model, the actualcoordinates of the fluorescence excitation point can bededuced from the detected fluorescence intensity distributionand used in focusing operations. This method has proven to befeasible in an XAFS experiment at the BL14W1 beamline ofthe Shanghai Synchrotron Radiation Facility.
基金
supported by National Nature Science Foundation of China(No.11175244)
