草菇V23子实体耐低温性能改良的初步研究

Preliminary Study on Improving the Tolerance of Volvariella volvacea Strain V23 Substance to Low-temperature

为了改良草菇V23子实体耐低温储藏性能,对其原生质体分别进行电子束诱变和60Co-γ射线诱变,用筛选出的耐低温突变体进行基因组重排。经过3轮基因组重排成功选育出1株能正常出菇的菌株VF;VF遗传稳定,其子实体在10℃条件下储藏期为20 h,比原始菌株V23储存期延长了25%。由此可见,用基因组重排技术提高草菇的耐低温性能是可行的。本研究结果为选育对环境耐受的食用菌菌株提供了新的思路。

To improve the performance of Volvariella volvacea strain V23 during low-temperature storage,The study performed mutagenesis on the protoplasts of V23 via electronic beam and60Co-γ ray radiation,respectively. Mutants with enhanced tolerance to low temperature were selected after three rounds of genome shuffling. One strain VF displaying normal fruiting and stable heredity was successfully obtained. The fruitbody of strain VF could be successfully stored for 20 h at 10℃,which was 25% longer than that of the original strain V23. The results proved that it is feasible to improve the low-temperature tolerance of Volvariella volvacea V23 using Genome shuffling technique. This work provides novel insights for cultivating edible fungi with enhanced performance under unfavorable environments.