基于S型结构的光纤光栅微位移传感器的研究

Research on fiber grating micro-displacement sensor based on S-bend structure

提出了一种特殊的光纤光栅传感器，该传感器在s型结构上刻写而成。在实验中，监测传感器透射光谱中的波谷特征波长实现微位移的测量。为了获取精准的测量数据，实验选取在1533．06nm（dipl）和1564．57nm（dip2）两处的干涉谷的特征波长作为观察的对象。通过理论分析和实验验证在0～70μm的微位移测量范围，两个干涉谷漂移量与微位移均呈现良好的线性关系。

A micro-displacement sensor was proposed by fabricating a long-period fiber grating （LPFG） in a section of S-bend structure （SBLPFG, S-bend LPFG）. In the experiment, the micro-displacement can be measured by monitoring the variation of wavelengths＇ shift. To obtain accuracy experimental data, two dips at 1533.06 nm（dip 1） and 1564.5 Thin（dip2） have been monitored in the experiment. After theoretical analysis and experiment verification, the linear relationship between the two dips＇ wavelength shifts and micro-displacement change in the range from 0-70μm was proved.