摘要
Ni0.7Zn0.3Fe2O4/Co0.8Fe2.2O4（NZFO/CFO） multilayer films are fabricated on Si（lO0） substrates by the chemical solution deposition method. The mierostructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 30Ohm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices.
Ni0.7Zn0.3Fe2O4/Co0.8Fe2.2O4（NZFO/CFO） multilayer films are fabricated on Si（lO0） substrates by the chemical solution deposition method. The mierostructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 30Ohm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices.
基金
Supported by the National Natural Science Foundation of China under Grant Nos 11274314,11374304,51102072,21201052 and U1632161
the Natural Science Major Foundation of Anhui Provincial Higher Education Institutions under Grant No KJ2012ZD14
the Natural Science Foundation of Anhui Province under Grant No 1508085MA18
the Postdoctoral Science Foundation of China under Grant No 2013M541848
the Foundation for University Key Teachers from Hefei Normal University under Grant No2014136JKC08
