摘要
分析了IGBT(Insulated Gate Bipolar Transistor)高压功率模块的内部电场绝缘问题。模块封装中使用的硅胶的电场承受能力直接影响了整个模块的绝缘表现,通过使用有限元分析方法,分析和确定了模块中最大电场存在的位置。结果表明,影响局部放电最关键的部分就是被硅胶覆盖的覆铜陶瓷基板,高的局部放电效应会使得硅胶绝缘失效,最终导致IGBT模块失效;最后提出了优化解决方案。
The inner electric field insulation problem of IGBT high voltage power module was analyzed. The electric field bearing capabilities of the silica gels used in the power module encapsulation directly affect the module insulation. The locations of max electric field were analyzed and ensured. Results show that the key part to affect local discharge is direct bonding copper plate covered by silicone gel. High partial discharge effect can make silicone gel insulation failure and result in IGBT modules failure. Finally, the optimal solution was proposed.
出处
《电子元件与材料》
CAS
CSCD
2016年第12期67-70,共4页
Electronic Components And Materials
关键词
IGBT模块
硅胶
BATIO3
有限元分析
电场模拟
局部放电
IGBT module
silicone gel
BaTiO3
finite element analysis
electric field simulation
partial discharge